This work presents crystallites characterization via XRD spectroscopy for ZnO nanoparticles previously prepared via hydrothermal technique at four different temperatures of 70, 100, 130 and 160 oC. As an industrial semiconductor, crystallite characterization is essential to rationally tune ZnO optical, mechanical, electrical and chemical properties. Braggs angles were used to estimate the internal distances, lattice constants and unit cell volumes. Scherre equation was used to estimate crystallites sizes and the number of unit cells inside a single crystallite. Williamson Hall analysis was used to estimate crystallites strain, crystallites stress and crystallites energy density. And finally, SSP analysis was used to estimate the relation between crystallites sizes and crystallites strain. In general, XRD spectroscopy has indicated an average crystallite size of 40 nm with a short elongated hexagonal unit cell which agglomerated as wurtzite like shapes. SEM images have indicated a gradual growth for ZnO nanoparticles starting at > 40 to end up at > 500 nm as temperatures increased from 70 to 160 oC.

ZnO Nanoparticles, ZnO Crystallites, Semiconductors, XRD Crystallography, Scherrer Equation, WH Analysis, SSP Analysis.