Characterization of feldspar mineral by Scanning Electron Microscopy (SEM).

Volume 21 No 2 (2023)

Nestor Ulloa , Miguel Ángel Sáez Paguay , María Fernanda Heredia Moyao , Greys Herrera

DOI: 10.48047/NQ.2023.21.2.NQ23043

Abstract

In the present study, the sample of an Ecuadorian feldspar was analyzed by means of the Scanning Electron Microscopy (SEM) technique, for the characterization of chemical components that are found forming the analyzed mineral, giving as a result of the presence of Oxygen, Sodium, Aluminum, and Silicon, in average amounts of weight percentage of 33.70, 3.07, 9.44, and 31.02% respectively, which indicates that the results show that the analyzed feldspar presents an albite phase ((Na,Ca)Al(Si,Al)3O8), mixed with a low concentration of quartz (SiO2). To validate these results, the uncertainty of the percentages by weight of each chemical element found in the feldspar sample was investigated and calculated by statistical analysis of standard deviation, giving as results an uncertainty error of ±0.39%, ±0.65%, ±0.86%, and ±0.73% respectively with a reliability of 95% for the results mentioned above

Keywords

Characterization; feldspar; SEM-EDS; morphology.

Copyright © Neuroquantology

Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Articles published in the Neuroquantology are available under Creative Commons Attribution Non-Commercial No Derivatives Licence (CC BY-NC-ND 4.0). Authors retain copyright in their work and grant IJECSE right of first publication under CC BY-NC-ND 4.0. Users have the right to read, download, copy, distribute, print, search, or link to the full texts of articles in this journal, and to use them for any other lawful purpose.