Volume 21 No 2 (2023)
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QUANTITATIVE ANALYSIS BY X-RAY DIFFRACTION FOR ROCKS OF GEOLOGICAL ORIGIN AND ESTIMATION OF THE UNCERTAINTY OF MEASUREMENT RESULTS
Evelyn Rosero , Marcos P. Barahona , Licett Ramos , Byron Serrano
Abstract
This work aims to estimate the uncertainty range of the results for the X-Ray Powder Diffraction (XRD) tests, which together with the Rietveld mathematical method allows for calculating the percentage of crystalline phases present in mineralogy. The uncertainty estimated for the XRD tests is for samples containing in a higher percentage of Albite and Microcline whose values are within an uncertainty range of ± 0.7wt% and ± 0.4wt%, respectively. The uncertainty values obtained are within a 95% confidence range, which corresponds realistically to what is required. Keywords: Characterization; X-ray diffraction; uncertainty; geological rocks; Rietveld’s method.
Keywords
Characterization; X-ray diffraction; uncertainty; geological rocks; Rietveld’s method.
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