Review on the Effect of Ion Mirror Phenomenon

Volume 18 No 1 (2020)

Muayyed Jabar Zoory, Safaa Farhood Madlul, Ahmed N. Abd

DOI: 10.14704/nq.2020.18.1.NQ20112

Abstract

This introductory article examines the phenomenon of the effect of the ionic mirror and the study of the concentrated ion beam (FIB) of the Quant - 200 3D dual-beam device to investigate the effect of the ionic mirror (IME) on the buffer sample during the injection process.This article provides an overview of an investigation into the details of the major control parameters that strongly influence the mirror-effect phenomenon (IME) within the Intensive Ionization Chamber (FIB) chamber. It has been planned to formulate the influence of each of those parameters mathematically. Furthermore a broad range of fundamental studies to finding a reasonable relation for using the ion mirror effect phenomena for analyzing insulator material with FIB instruments.

Keywords

Ion Mirror Effect, Insulator Charging Effect, Ion Beam, Sample Potential, Ion Beam Potential, Scanning Beam Current.

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